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MANUFACTURING METHOD OF LOCAL WIRING ON SILICON-GERMANIUM THREE-DIMENSIONAL STRUCTURE CMOS

机译:硅锗三维结构CMOS局部布线的制造方法

摘要

PROBLEM TO BE SOLVED: To form local wiring between a silicon CMOS element and a germanium CMOS element easily, in a silicon-germanium three-dimensional structure CMOS.;SOLUTION: A silicon substrate having a silicon CMOS element is prepared (12), and an insulating layer is formed on the top of the element (14). The insulating layer is partially opened (16), and then a germanium thin film is formed thereon (18). By annealing treatment, the germanium of the thin film is fluidized (24). Thereby the germanium flows into the opening part, and a contact point is formed between the germanium and the silicon substrate, the silicon CMOS element. In addition, by cooling, the germanium is crystallized by LPE growth (26). Thereby the germanium CMOS element is formed on a single crystal germanium.;COPYRIGHT: (C)2007,JPO&INPIT
机译:要解决的问题:为了在硅锗3维结构CMOS中轻松地在硅CMOS元件和锗CMOS元件之间形成局部布线;解决方案:准备具有硅CMOS元件的硅基板(12),并且在元件(14)的顶部上形成绝缘层。绝缘层被部分地打开(16),然后在其上形成锗薄膜(18)。通过退火处理,使薄膜的锗流化(24)。由此,锗流入开口部,在锗与硅基板即硅CMOS元件之间形成接触点。另外,通过冷却,锗通过LPE生长而结晶(26)。从而在单晶锗上形成锗CMOS元件。;版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2007251131A

    专利类型

  • 公开/公告日2007-09-27

    原文格式PDF

  • 申请/专利权人 SHARP CORP;

    申请/专利号JP20070002807

  • 申请日2007-01-10

  • 分类号H01L21/8238;H01L27/092;H01L27/00;H01L21/8244;H01L27/11;H01L21/28;H01L29/417;H01L23/522;H01L21/768;

  • 国家 JP

  • 入库时间 2022-08-21 21:14:32

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