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PROBE ASSEMBLY WITH IMPEDANCE-CONTROLLED SPRING CONTACT PIN OR RESISTOR TIP SPRING PIN CONTACT PIN

机译:用阻抗控制的弹簧触点销或电阻器尖端弹簧销来组装探针

摘要

PROBLEM TO BE SOLVED: To control an uncontrolled characteristic impedance along a spring energizing type probe pin.;SOLUTION: The characteristic impedance along the spring energizing type probe pin is prevented from being brought into an uncontrolled state, by providing a stepped shelf ground layer 29 extended outwards along the spring energizing type probe pins 7, 42 and toward a probed target signal direction. A length of an extended part is selected to cover a shelf with the whole exposed portion of the pin, while generating contact and keeping it, even when only (or at least) the minimum compression amount of a spring is predicted. A stepped depth of the shelf is selected to generate Z0 matched with the Z0 of transmission lines 5, 6, 34, 35 existing already within a probe assembly, as to the exposed portion of the pin. The spring energizing type probe pin may be a resistor tip spring pin having a small resistor 13 in its tip.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:要控制沿弹簧激励型探针的失控特性阻抗;解决方案:通过设置阶梯式接地层29,可以防止沿弹簧激励型探针的特性阻抗处于失控状态。沿弹簧激励型探针7、42向外并朝着被探测目标信号方向向外延伸。即使仅预测(或至少)弹簧的最小压缩量,也要选择延伸部分的长度来覆盖销子整个暴露的部分,同时保持并保持接触。选择架子的阶梯深度以生成与探头组件中已经存在的传输线5、6、34、35的Z 0 相匹配的Z 0 引脚的裸露部分。弹簧加力型探针可以是电阻器尖端,其尖端中具有小的电阻器13。版权所有:(C)2007,JPO&INPIT

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