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ALIGNMENT ANGLE INSPECTION DEVICE OF PHOTOELECTRIC ENCODER

机译:光电编码器的对角检测装置

摘要

PROBLEM TO BE SOLVED: To evaluate alignment deviation in the rotation direction easily, quantitatively and highly accurately.;SOLUTION: This photoelectric encoder for detecting relative displacement between a scale 10 and a detection head 20 is provided with inspection lattices 42a, 42b having plus and minus angle offset θof to reference lattices 26, 12, and angle deviation between the lattices is detected based on a light receiving signal acquired by interaction between an inspection lattice and a reference lattice or a reference lattice for inspection disposed at the same angle as the reference lattice.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:为了容易,定量且高精度地评估旋转方向上的对准偏差;解决方案:该用于检测标尺10和检测头20之间的相对位移的光电编码器设置有具有加号和加号的检查格子42a,42b。相对于参考格子26、12的角度偏移θ的负角度θ为零,并且基于通过检查格子与参考格子或与检查格子布置成相同角度的参考格子之间的相互作用而获得的光接收信号,来检测格子之间的角度偏离。参考点阵。; COPYRIGHT:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2007218755A

    专利类型

  • 公开/公告日2007-08-30

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20060040160

  • 发明设计人 KOJIMA KENJI;

    申请日2006-02-17

  • 分类号G01D5/36;

  • 国家 JP

  • 入库时间 2022-08-21 21:14:06

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