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X-RAY MEASURING APPARATUS, X-RAY MEASURING METHOD AND X-RAY MEASURING PROGRAM

机译:X射线测定装置,X射线测定方法及X射线测定程序

摘要

PPROBLEM TO BE SOLVED: To provide an X-ray measuring apparatus capable of obtaining an excellent panoramic images by having an X-ray source and a detector move on a simple circular trajectory, an X-ray measuring method and an X-ray measuring program. PSOLUTION: The X-ray source 3 and the detector 4 are held facing each other. A control processor 8 calculates a normal to the trajectory respectively for a plurality of points under consideration positioned on the trajectory of an object in a space set on an inspection object, calculates the position of the X-ray source 3 corresponding to the points under consideration on the basis of the calculated normal, sets the respective positions of the plurality of X-ray sources 3 on the trajectory near the position of the X-ray source 3 corresponding to the points under consideration, and for data acquired from the detector 4 when being at a position facing the set position of the X-ray source 3, acquires a tomographic image by extracting a prescribed part where the normal passes through from the data, and generates a first panoramic image by sticking the acquired tomographic images together on the basis of the positions of the points under consideration. PCOPYRIGHT: (C)2007,JPO&INPIT
机译:

要解决的问题:提供一种能够通过使X射线源和检测器沿简单的圆形轨迹移动而获得出色的全景图像的X射线测量装置,X射线测量方法和X-射线射线测量程序。

解决方案:X射线源3和检测器4彼此面对。控制处理器8针对在检查对象上设置的空间中位于对象的轨迹上的多个考虑点分别计算轨迹的法线,并计算与考虑点相对应的X射线源3的位置基于所计算的法线,在轨迹上将多个X射线源3的各个位置设置在与考虑中的点相对应的X射线源3的位置附近,并且对于从检测器4获取的数据在以下情况下进行设置:在面向X射线源3的设置位置的位置处,通过从数据中提取法线穿过的指定部分来获取断层图像,并且通过将获取到的断层图像粘贴在一起来生成第一全景图像。所考虑点的位置。

版权:(C)2007,日本特许厅&INPIT

著录项

  • 公开/公告号JP2007159635A

    专利类型

  • 公开/公告日2007-06-28

    原文格式PDF

  • 申请/专利权人 HITACHI MEDICAL CORP;

    申请/专利号JP20050356342

  • 发明设计人 UEDA TAKESHI;BABA RIKA;

    申请日2005-12-09

  • 分类号A61B6/14;G06T1/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:14:01

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