首页> 外国专利> MULTILAYER GATE ELECTRODE AND METHOD FOR MANUFACTURING SAME, AND SEMICONDUCTOR DEVICE WITH MULTILAYER GATE ELECTRODE FORMED THEREIN AND METHOD FOR MANUFACTURING THE SAME

MULTILAYER GATE ELECTRODE AND METHOD FOR MANUFACTURING SAME, AND SEMICONDUCTOR DEVICE WITH MULTILAYER GATE ELECTRODE FORMED THEREIN AND METHOD FOR MANUFACTURING THE SAME

机译:多层栅极电极及其制造方法,具有该多层栅极电极的半导体装置及其制造方法

摘要

PROBLEM TO BE SOLVED: To provide: a stable multilayer gate electrode in which the characteristics, such as resistance, have been improved, at high temperatures and with high reliability; a semiconductor including the same; a method for manufacturing a multilayer gate electrode; and a method for manufacturing a semiconductor device.;SOLUTION: The multilayer gate electrode includes: a polycrystal semiconductor film formed on a gate insulating film and doped with conductive impurities; an ohmic contact film formed on the polycrystal semiconductor film and including tungsten (W1-x) and non-tungsten metal (Mx, x=0.01 to 0.55); a metal barrier film formed on the ohmic contact film; and a high-melting-point metal film formed on the metal barrier film.;COPYRIGHT: (C)2007,JPO&INPIT
机译:要解决的问题:提供一种稳定的多层栅电极,该栅电极在高温和高可靠性下已改善了电阻等特性。包括该半导体的半导体;制造多层栅电极的方法;解决方案:多层栅电极包括:形成在栅绝缘膜上并掺杂有导电杂质的多晶半导体膜;形成在多晶半导体膜上并包括钨(W1-x)和非钨金属(Mx,x = 0.01至0.55)的欧姆接触膜;在欧姆接触膜上形成的金属阻挡膜; ;在金属阻挡膜上形成的高熔点金属膜。;版权所有:(C)2007,日本特许会计师事务所

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