首页> 外国专利> DEFORMING METHOD FOR VARIATION MIRROR, ABERRATION COMPENSATION METHOD FOR OPTICAL DEVICE, AND ABERRATION COMPENSATION METHOD FOR FUNDUS OBSERVATION DEVICE

DEFORMING METHOD FOR VARIATION MIRROR, ABERRATION COMPENSATION METHOD FOR OPTICAL DEVICE, AND ABERRATION COMPENSATION METHOD FOR FUNDUS OBSERVATION DEVICE

机译:变镜的变形方法,光学设备的像差补偿方法以及眼底观察设备的像差补偿方法

摘要

PPROBLEM TO BE SOLVED: To deform a variation mirror using a Zernike voltage template suitable for aberration correction by calibrating according to the use environment and production error of individual variation mirror. PSOLUTION: The deformation method for a variation mirror: having a reflecting face which induces distortion by an electrostatic voltage applied on a plurality of electrodes; detecting reflected light on the reflecting face; measuring supply voltages on the respective electrodes when the mirror has a desired reflecting face shape; preliminarily memorizing a predetermined number of groups of voltages corresponding to a predetermined number of reflecting face shapes, wherein one group representing supply voltages on the respective electrodes corresponding to one reference reflecting face shape; and superposing a group of the memorized electrodes and supply voltages so as to deform the mirror into a desired reflecting face shape. The variation mirror is deformed by comparing a memorized detection signal and an actually detected detection signal and correcting the memorized detection signal based on the use environment conditions such as humidity and production errors so as to obtain a desired detection signal. PCOPYRIGHT: (C)2007,JPO&INPIT
机译:

要解决的问题:通过使用一个适用于像差校正的Zernike电压模板,通过根据单个变倍镜的使用环境和生产误差进行校准,使变倍镜变形。解决方案:用于变化镜的变形方法:具有反射面,该反射面通过施加在多个电极上的静电电压引起畸变。检测反射面上的反射光;当反射镜具有所需的反射面形状时,测量各个电极上的电源电压;预先存储与预定数量的反射面形状相对应的预定数量的电压组,其中,一组表示与一个参考反射面形状相对应的各个电极上的电源电压;叠加一组存储的电极和电源电压,以使反射镜变形为所需的反射面形状。通过比较存储的检测信号和实际检测到的检测信号并基于诸如湿度和生产误差之类的使用环境条件校正存储的检测信号来使变化镜变形,以获得期望的检测信号。

版权:(C)2007,日本特许厅&INPIT

著录项

  • 公开/公告号JP2007025504A

    专利类型

  • 公开/公告日2007-02-01

    原文格式PDF

  • 申请/专利权人 TOPCON CORP;

    申请/专利号JP20050210680

  • 申请日2005-07-20

  • 分类号G02B5/10;A61B3/12;A61B3/10;

  • 国家 JP

  • 入库时间 2022-08-21 21:11:27

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