首页> 外国专利> Being the yield rate forecasting device and the yield rate

Being the yield rate forecasting device and the yield rate

机译:作为良率预测装置和良率

摘要

PURPOSE: To provide a yield estimating device of semiconductor chips by which the estimation of the yield can be made at high speed without needing a massive memory area. ;CONSTITUTION: A particle forming part 12 forms noise particles to adhere to a plurality of semiconductor chips, and makes semiconductor chip identification numbers by the noise grains. An implanter 13 implants all the noise grains onto one mask stored in a circuit storage 15. A defect detector 16 examines whether the noise gains causes defects or not, by checking the mask pattern in the vicinity of the implanted noise grains. A semiconductor chip defect detector 17 detects the semiconductor chip which has caused the defect, based on the semiconductor chip identification number of each noise grain. And, an operating part 18 computers the yield of the semiconductor chip by the number of semiconductor chips which have not caused defects and the number of all semiconductor chips.;COPYRIGHT: (C)1996,JPO
机译:目的:提供一种半导体芯片的成品率估计装置,通过该装置可以在不需要大量存储区域的情况下高速进行成品率估计。 ;组成:颗粒形成部分12形成噪声颗粒以粘附到多个半导体芯片上,并通过噪声颗粒确定半导体芯片的识别号。注入器13将所有噪声颗粒注入到存储在电路存储器15中的一个掩模上。缺陷检测器16通过检查所注入的噪声颗粒附近的掩模图案来检查噪声增益是否引起缺陷。半导体芯片缺陷检测器17基于每个噪声颗粒的半导体芯片识别号来检测引起缺陷的半导体芯片。并且,操作部18通过未引起缺陷的半导体芯片的数量和全部半导体芯片的数量来对半导体芯片的成品率进行计算。版权所有:(C)1996,JPO

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号