首页> 外国专利> METHOD OF MANUFACTURING GALLIUM NITRIDE TRANSISTOR, METHOD OF PROCESSING GALLIUM NITRIDE SEMICONDUCTOR REGION, AND METHOD OF ELIMINATING RESIST

METHOD OF MANUFACTURING GALLIUM NITRIDE TRANSISTOR, METHOD OF PROCESSING GALLIUM NITRIDE SEMICONDUCTOR REGION, AND METHOD OF ELIMINATING RESIST

机译:氮化镓晶体管的制造方法,氮化镓半导体区域的处理方法以及消除电阻的方法

摘要

PROBLEM TO BE SOLVED: To provide a method of manufacturing gallium nitride transistors for reducing the occurrence of nitrogen vacancy in removing resist, a method of processing a gallium nitride semiconductor region, and a method of removing the resist.;SOLUTION: A resist mask 29 with a pattern is provided on a substrate 19a, including first and second gallium nitride semiconductor layers 13a, 15a for the gallium nitride transistors. The gallium nitride semiconductor of the substrate 19a is etched, by using the resist mask 29 to form the first and second gallium nitride semiconductor layers 13a, 15a, which have been partially removed. After the etching, the substrate 19a is exposed to fluorine gas plasma 39, to remove the resist mask 29 and to apply nitrogen termination to the surface of the substrate 19a. The occurrence of desorption of nitrogen is reduced from the substrate surface.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种用于减少在去除抗蚀剂时氮空位的发生的氮化镓晶体管的制造方法,一种处理氮化镓半导体区域的方法以及一种去除抗蚀剂的方法。解决方案:抗蚀剂掩模29在基板19a上设置有具有图案的图案,该基板包括用于氮化镓晶体管的第一和第二氮化镓半导体层13a,15a。通过使用抗蚀剂掩模29蚀刻衬底19a的氮化镓半导体,以形成已经被部分去除的第一和第二氮化镓半导体层13a,15a。蚀刻之后,将基板19a暴露于氟气等离子体39中,以去除抗蚀剂掩模29并将氮终止施加至基板19a的表面。从基材表面减少了氮的解吸。.版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2006351955A

    专利类型

  • 公开/公告日2006-12-28

    原文格式PDF

  • 申请/专利权人 SUMITOMO ELECTRIC IND LTD;

    申请/专利号JP20050178214

  • 发明设计人 MIYAZAKI TOMIHITO;

    申请日2005-06-17

  • 分类号H01L21/338;H01L29/778;H01L29/812;H01L21/3065;G03F7/42;H01L21/027;H01L29/78;

  • 国家 JP

  • 入库时间 2022-08-21 21:08:57

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