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Survey instrument null of the lead/read

机译:调查仪器的线索/读数为空

摘要

PROBLEM TO BE SOLVED: To inspect all pieces for defects in the surface state of a lead frame which continues in the form of a strip, while conveying the lead frame continuously. ;SOLUTION: This device includes a CCD(charge-coupled device) camera 6c, which captures an image of one piece of a lead frame 3 taking the form of a strip conveyed, and a control means 8 for performing an inspection process in which, from the input of the image captured by the CCD camera 6c, the means 8 analyzes the brightness of the image to compare the analytical value obtained with a reference value prestored in a storage portion, to detect defects in the lead frame 3. The CCD camera 6c captures images within a viewing field involving one piece of the continuously conveyed lead frame 3 as still images at a time. The control means 8 performs an inspection process on all the pieces while capturing, one by one via the CCD camera 6c, the still images of the pieces contained within the lead frame 3.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:在连续运输引线框架的同时,检查所有零件在引线框架表面状态下的缺陷,引线表面呈条状。 ;解决方案:该设备包括一个CCD(电荷耦合器件)照相机6c,该照相机捕获呈带状传送的一块引线框架3的图像,以及一个控制装置8,用于执行检查过程,从CCD摄像机6c捕获的图像的输入开始,装置8分析图像的亮度,以将获得的分析值与预先存储在存储部分中的参考值进行比较,以检测引线框架3中的缺陷。图6c以一次静止图像的形式捕获包括一个连续传送的引线框架3的视野内的图像。控制装置8在通过CCD摄像机6c一个接一个地捕获引线框架3内所包含的块的静止图像的同时,对所有块进行检查处理。版权所有:(C)1998,JPO

著录项

  • 公开/公告号JP3886205B2

    专利类型

  • 公开/公告日2007-02-28

    原文格式PDF

  • 申请/专利权人 アピックヤマダ株式会社;

    申请/专利号JP19970107828

  • 发明设计人 牧野 晴久;舟田 年明;

    申请日1997-04-24

  • 分类号G01B11/24;G01N21/89;

  • 国家 JP

  • 入库时间 2022-08-21 21:08:05

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