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Hollow cathode magnetron sputtering targets and methods of forming hollow cathode magnetron sputtering targets

机译:中空阴极磁控溅射靶及形成中空阴极磁控溅射靶的方法

摘要

The invention includes methods of forming hollow cathode magnetron sputtering targets. A metallic material is processed to produce an average grain size of less than or equal to about 30 microns and subsequently subjected to deep drawing. The invention includes three-dimensional sputtering targets comprising materials containing at least one element selected from Cu, Ti, and Ta. The target has an average grain size of from about 0.2 microns to about 30 microns throughout the target and a grain size standard deviation of less than or equal to 15% (1-σ). The invention includes three-dimensional targets comprising Al, having an average grain size of from 0.2 microns to less than 150 micron, with a grain size standard deviation of less than or equal to 15% (1-σ).
机译:本发明包括形成空心阴极磁控溅射靶的方法。处理金属材料以产生小于或等于约30微米的平均晶粒尺寸,然后进行深冲。本发明包括三维溅射靶,该三维溅射靶包括含有选自铜,钛和钽中的至少一种元素的材料。在整个靶中,靶的平均晶粒尺寸为约0.2微米至约30微米,并且晶粒尺寸标准偏差小于或等于15%(1-σ)。本发明包括三维靶,该三维靶包含Al,其平均晶粒尺寸为0.2微米至小于150微米,且晶粒尺寸标准偏差小于或等于15%(1-σ)。

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