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HOLLOW CATHODE MAGNETRON SPUTTERING TARGETS AND METHODS OF FORMING HOLLOW CATHODE MAGNETRON SPUTTERING TARGETS

机译:空心阴极磁控溅射靶和形成空心阴极磁控溅射靶的方法

摘要

Title: HOLLOW CATHODE MAGNETRON SPUTTERING TARGETS AND METHODS OF FORMING HOLLOW CATHODE MAGNETRON SPUTTERING TARGETS[err] Abstract: The invention includes methods of forming hollow cathode magnetron sputtering targets. A metallic material is processed to produce an average grain size of less than or equal to about 30 microns and subsequently subjected to deep drawing. The invention includes three-dimensional sputtering targets comprising materials containing at least one element selected from Cu, Ti, and Ta. The target has an average grain size of from about 0.2 microns to about 30 microns throughout the target and a grain size standard deviation of less than or equal to 15% (1-(Y). The invention includes three-dimensional targets comprising Al, having an average grain size of from 0.2 microns to less than 150 micron, with a grain size standard deviation of less than or equal to 15% (1-6).
机译:标题:空心阴极磁控溅射靶及形成空心的方法阴极磁控溅射靶[呃]摘要:本发明包括形成空心阴极磁控溅射靶的方法。金属材料是加工以产生小于或等于约30微米的平均晶粒尺寸,然后进行深冲。本发明包括三维溅射靶,该三维溅射靶包括含有至少一种选自Cu的元素的材料,钛和钽。靶材的整个靶材的平均晶粒尺寸为约0.2微米至约30微米,并且晶粒尺寸为标准偏差小于或等于15%(1-(Y)。本发明包括三维目标,其中包含Al,且平均晶粒尺寸为0.2微米至小于150微米,且晶粒尺寸标准偏差小于或等于15%(1-6)。

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