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Method for measuring diffraction patterns from a transmission electron microscopy to determine crystal structures and a device therefor
Method for measuring diffraction patterns from a transmission electron microscopy to determine crystal structures and a device therefor
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机译:从透射电子显微镜测量衍射图以确定晶体结构的方法及其装置
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摘要
A device and method which enable a transmission electron microscope to measure electron diffraction patterns of a sample very precisely are disclosed. The patterns are suitable for structure determination. The electron beam is precessed by means of deflector coils (6) in the transmission electron microscope before the sample (4), in combination with a similar precession of the electron diffraction pattern by means of deflector coils (9) situated after the sample. The electron diffraction pattern is scanned by means of deflector coils (9) situated after the sample.
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