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Technique for perfecting the active regions of wide bandgap semiconductor nitride devices

机译:完善宽带隙半导体氮化物器件有源区的技术

摘要

This invention pertains to electronic/optoelectronic devices with reduced extended defects and to a method for making it. The device includes a substrate, a semiconductor active material deposited on said substrate, and electrical contacts. The semiconductor active material defines raised structures having atomically smooth surfaces. The method includes the steps of depositing a dielectric thin film mask material on a semiconductor substrate surface; patterning the mask material to form openings therein extending to the substrate surface; growing active material in the openings; removing the mask material to form the device with reduced extended defect density; and depositing electrical contacts on the device.
机译:本发明涉及具有减少的扩展缺陷的电子/光电装置及其制造方法。该装置包括衬底,沉积在所述衬底上的半导体活性材料以及电触点。半导体活性材料限定了具有原子光滑表面的凸起结构。该方法包括在半导体衬底表面上沉积介电薄膜掩模材料的步骤;构图掩模材料以在其中形成延伸到衬底表面的开口;开口中生长的活性物质;去除掩模材料以形成具有减小的扩展缺陷密度的器件;并在设备上放置电触点。

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