首页> 外国专利> Pendeoepitaxial methods of fabricating gallium nitride semiconductor layers on sapphire substrates, and gallium nitride semiconductor structures fabricated thereby

Pendeoepitaxial methods of fabricating gallium nitride semiconductor layers on sapphire substrates, and gallium nitride semiconductor structures fabricated thereby

机译:在蓝宝石衬底上制造氮化镓半导体层的五外延方法以及由此制造的氮化镓半导体结构

摘要

More specifically, gallium nitride semiconductor layers may be fabricated by etching an underlying gallium nitride layer on a sapphire substrate, to define at least one post in the underlying gallium nitride layer and at least one trench in the underlying gallium nitride layer. The at least one post includes a gallium nitride top and a gallium nitride sidewall. The at least one trench includes a trench floor. The gallium nitride sidewalls are laterally grown into the at least one trench, to thereby form a gallium nitride semiconductor layer. However, prior to performing the laterally growing step, the sapphire substrate and/or the underlying gallium nitride layer is treated to prevent growth of gallium nitride from the trench floor from interfering with the lateral growth of the gallium nitride sidewalls of the at least one post into the at least one trench. Embodiments of gallium nitride semiconductor structures according to the present invention can include a sapphire substrate and an underlying gallium nitride layer on the sapphire substrate. The underlying gallium nitride layer includes therein at least one post and at least one trench. The at least one post each includes a gallium nitride top and a gallium nitride sidewall. The at least one trench includes a sapphire floor. A lateral gallium nitride layer extends laterally from the gallium nitride sidewall of the at least one post into the at least one trench. In a preferred embodiment, the at least one trench extends into the sapphire substrate such that the at least one post each includes a gallium nitride top, a gallium nitride sidewall and a sapphire sidewall and the at least one trench includes a sapphire floor. The sapphire floor preferably is free of a vertical gallium nitride layer thereon and the sapphire sidewall height to sapphire floor width ratio preferably exceeds about 1/4. A mask may be included on the sapphire floor and an aluminum nitride buffer layer also may be included between the sapphire substrate and the underlying gallium nitride layer. A mask also may be included on the gallium nitride top.
机译:更具体地,可以通过在蓝宝石衬底上蚀刻下面的氮化镓层来制造氮化镓半导体层,以在下面的氮化镓层中限定至少一个柱并且在下面的氮化镓层中限定至少一个沟槽。至少一个柱包括氮化镓顶部和氮化镓侧壁。至少一个沟槽包括沟槽底部。氮化镓侧壁横向生长到至少一个沟槽中,从而形成氮化镓半导体层。然而,在执行横向生长步骤之前,对蓝宝石衬底和/或下面的氮化镓层进行处理以防止来自沟槽底部的氮化镓的生长干扰至少一个柱的氮化镓侧壁的横向生长。进入至少一个沟槽。根据本发明的氮化镓半导体结构的实施例可以包括蓝宝石衬底和在蓝宝石衬底上的下面的氮化镓层。下层的氮化镓层在其中包括至少一个柱和至少一个沟槽。至少一个柱分别包括氮化镓顶部和氮化镓侧壁。至少一个沟槽包括蓝宝石地板。侧向氮化镓层从至少一个柱的氮化镓侧壁横向延伸到至少一个沟槽中。在一优选实施例中,至少一个沟槽延伸到蓝宝石衬底中,使得至少一个柱每个包括氮化镓顶部,氮化镓侧壁和蓝宝石侧壁,并且至少一个沟槽包括蓝宝石基底。蓝宝石基底优选地在其上没有垂直氮化镓层,并且蓝宝石侧壁高度与蓝宝石基底宽度的比率优选地超过大约1/4。掩模可以包括在蓝宝石基底上,并且氮化铝缓冲层也可以包括在蓝宝石衬底和下面的氮化镓层之间。掩模也可以包括在氮化镓顶部上。

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