首页> 外国专利> METHOD FOR THE MONOLITHIC INTEGRATION OF MATERIALS OF HIGH MECHANICAL QUALITY WITH INTEGRATED CIRCUITS FOR MEMS/NEMS APPLICATIONS

METHOD FOR THE MONOLITHIC INTEGRATION OF MATERIALS OF HIGH MECHANICAL QUALITY WITH INTEGRATED CIRCUITS FOR MEMS/NEMS APPLICATIONS

机译:MEMS / NEMS应用中集成电路的高机械质量材料的整体积分方法

摘要

The invention relates to a method for the monolithic integration of materials of high mechanical quality with integrated circuits for MEMS/NEMS applications. According to the invention, a structure with at least three layers is used to form the electronic circuitry and the micro-/nano-electromechanical systems, said layers comprising: a lower or base layer which is intended to be used to form the electronic circuits, an intermediate insulating layer, and an upper layer which is used to form at least part of said MEMS/NEMS. The structure with at least three layers comprises a substrate, such as an SOI substrate, the layers of which are joined to one another prior to the formation therein of the electronic circuits and the MEMS/NEMS, thereby defining areas on the upper and intermediate layers in which said MEMS/NEMS are to be formed and eliminating the remainder of the layers so that the lower layer can be accessed and the electronic circuitry can be formed using standard techniques.
机译:本发明涉及一种用于将高机械质量的材料与用于MEMS / NEMS应用的集成电路进行单片集成的方法。根据本发明,具有至少三层的结构用于形成电子电路和微/纳米机电系统,所述层包括:旨在用于形成电子电路的下层或基层;中间绝缘层和用于形成所述MEMS / NEMS的至少一部分的上层。具有至少三层的结构包括衬底,例如SOI衬底,该衬底的各层在其中形成电子电路和MEMS / NEMS之前彼此接合,从而在上层和中间层上限定区域其中将形成所述MEMS / NEMS并消除其余的层,从而可以使用标准技术来访问下层并且可以形成电子电路。

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