首页> 外国专利> FLIM TYPE SEMICONDUCTOR PACKAGE WITH LEAD CHANGED SHAPE AND JOINING STRUCTURE OF THE LEAD AND BUMP

FLIM TYPE SEMICONDUCTOR PACKAGE WITH LEAD CHANGED SHAPE AND JOINING STRUCTURE OF THE LEAD AND BUMP

机译:铅型异形和铅与焊缝的连接结构的薄膜型半导体封装

摘要

Protrusion-bonding structure of film-type semiconductor package and the deformation for leading to the shape for disclosing lead. It is equipped with the film-type semiconductor package of basal film, an integrated circuit chip, multiple raised and multiple lead according to an embodiment of the present invention with the variation of a lead format. Basal film be provided with it is multiple at one end on output lead and multiple inputs of the other end are grouped. One integrated circuit chip is installed on basal film. By a predetermined altitude, multiple protrusions are arranged on the active surface of integrated circuit chip prominent. Multiple lead are electrically connected to integrated circuit chip by protrusion and input/output is followed closely. La wherein have a common boundary and engage by the protrusion of region and lead, lead/output lead mouth and when head harness interconnecting piece is for connection bump unit length, the region of the joint area unit length bigger than connection. Film to pressure to lead shape according to the present invention wherein semiconductor packages and protrusion lead it is glued by increase protrusion and lead junction area and by modify lead boundary shape and the connection between lead and protrusion protrusion structure enhance, phenomenon of guarding against deviations have the advantage that increase film-type semiconductor package assembly process yield.
机译:薄膜型半导体封装的凸键合结构和导致引线暴露的形状的变形。根据本发明的实施例,其配备有基膜的膜型半导体封装,集成电路芯片,多根凸起和多根引线,并且引线格式有所变化。在输出引线的一端具有多个底膜,而在另一端的多个输入被分组。在基膜上安装一个集成电路芯片。在预定高度上,多个突起被布置在突出的集成电路芯片的有源表面上。多根引线通过突起电连接到集成电路芯片,并且紧跟着输入/输出。在图1a中,La具有共同的边界,并且通过区域和引线,引线/输出引线嘴的突出部接合,并且当头线束互连件用于连接凸点单元长度时,接合区域单元长度的区域大于连接区域。根据本发明的膜压成引线形状,其中通过增加突起和引线接合面积并通过改变引线边界形状来胶合半导体封装和突起引线,并且增强了引线和突起突起结构之间的连接,防止了偏离现象优点是增加了薄膜型半导体封装组装工艺的成品率。

著录项

  • 公开/公告号KR20070038234A

    专利类型

  • 公开/公告日2007-04-10

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20050093318

  • 发明设计人 CHUNG YE CHUNG;

    申请日2005-10-05

  • 分类号H01L21/60;H01L23/495;

  • 国家 KR

  • 入库时间 2022-08-21 20:35:53

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