首页> 外国专利> SILICON WET ETCHING METHOD USING PARYLENE MASK AND METHOD OF MANUFACTURING NOZZLE PLATE OF INKJET PRINTHEAD USING THE WET ETCHING METHOD

SILICON WET ETCHING METHOD USING PARYLENE MASK AND METHOD OF MANUFACTURING NOZZLE PLATE OF INKJET PRINTHEAD USING THE WET ETCHING METHOD

机译:利用聚对二甲苯掩膜的硅湿法提取方法和利用湿法提取法制造喷墨打印头喷嘴板的方法

摘要

A silicon wet etching method using a parylene mask and a method for manufacturing a nozzle plate of an inkjet printhead using the same are provided to minimize thermal defects inside of a silicon substrate generated by a thermal oxidization process by reducing the number of thermal oxidization processes for the silicon substrate. A silicon wet etching method using a parylene mask includes the steps of forming a first etching mask made of a parylene on a surface of a silicon substrate(200'), forming a first element by primarily wet etching the silicon substrate by using the first etching mask, forming a second etching mask made of a silicon oxidization film on the surface of the silicon substrate, and forming a second element by secondly wet etching the silicon substrate by using the second etching mask, wherein the silicon wet etching method forms at least two elements having a shape different from each other on the silicon substrate by at least two wet etching processes.
机译:提供一种使用聚对二甲苯掩模的硅湿法刻蚀方法以及使用该方法的喷墨打印头的喷嘴板的制造方法,以通过减少用于氧化的热氧化法的数量来最小化由热氧化法产生的硅基板内部的热缺陷。硅基板。使用聚对二甲苯掩模的硅湿法刻蚀方法包括以下步骤:在硅衬底(200')的表面上形成由聚对二甲苯制成的第一刻蚀掩模;通过使用第一刻蚀对硅衬底进行初步湿法刻蚀来形成第一元件。掩模,在硅基板的表面上形成由硅氧化膜制成的第二蚀刻掩模,并通过使用第二蚀刻掩模对硅基板进行第二次湿蚀刻来形成第二元素,其中,硅湿蚀刻法形成至少两个通过至少两个湿蚀刻工艺在硅衬底上具有彼此不同形状的元素。

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