首页> 外国专利> KNIFE EDGE RING AND SEMICONDUCTOR DEVELOP EQUIPMENT HAVING THE SAME AND WAFER BACK-SIDE WASHING METHOD OF SEMICONDUCTOR DEVELOP EQUIPMENT

KNIFE EDGE RING AND SEMICONDUCTOR DEVELOP EQUIPMENT HAVING THE SAME AND WAFER BACK-SIDE WASHING METHOD OF SEMICONDUCTOR DEVELOP EQUIPMENT

机译:具有相同的和晶圆背面冲洗方法的刀刃环和半导体显影设备

摘要

A knife edge ring, semiconductor developing equipment having the same, and a method for cleaning a wafer bottom in the semiconductor developing equipment are provided to prevent a bad pattern from being formed on an upper surface of a wafer edge in a baking process. A body(110) has an inner side wall, an outer side wall, and a top surface having a width, in which a multi-stage inclined portion(113) is formed on the outer side wall. Plural discharge holes(111) penetrate the body, and each of the discharge holes has an inlet positioned along the inclined portion. The inlet has a cross section area larger than that of the discharge hole. A bottom surface of the body is positioned at an obtuse angle to an inclined portion.
机译:提供一种刀口环,具有该刀口环的半导体显影设备以及在该半导体显影设备中清洁晶片底部的方法,以防止在烘烤过程中在晶片边缘的上表面上形成不良图案。主体(110)具有内侧壁,外侧壁和具有一定宽度的顶表面,其中,在该外侧壁上形成有多级倾斜部分(113)。多个排出孔(111)贯穿主体,并且每个排出孔具有沿着倾斜部分定位的入口。入口的横截面积大于排放孔的横截面积。主体的底表面相对于倾斜部分成钝角定位。

著录项

  • 公开/公告号KR20070082450A

    专利类型

  • 公开/公告日2007-08-21

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20060015335

  • 发明设计人 CHOI DUG KYU;

    申请日2006-02-16

  • 分类号H01L21/304;

  • 国家 KR

  • 入库时间 2022-08-21 20:33:43

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