首页> 外国专利> KNIFE EDGE RING AND SEMICONDUCTOR DEVELOP EQUIPMENT HAVING THE SAME AND WAFER BACK-SIDE WASHING METHOD OF SEMICONDUCTOR DEVELOP EQUIPMENT

KNIFE EDGE RING AND SEMICONDUCTOR DEVELOP EQUIPMENT HAVING THE SAME AND WAFER BACK-SIDE WASHING METHOD OF SEMICONDUCTOR DEVELOP EQUIPMENT

机译:具有相同的和晶圆背面冲洗方法的刀刃环和半导体显影设备

摘要

A knife edge ring apparatus is provided for use during semiconductor manufacturing which includes a ring-shaped body having an inner side wall, an outer side wall and a top surface having a predetermined width. A multi-staged inclined portion is formed in the outer side wall and a plurality of discharge holes penetrate the body. Each of the discharge holes have an inlet associated therewith positioned at the inclined portion. The knife edge ring allows developer and cleaning solution to be discharged away from the wafer. A method of cleaning the bottom surface of a semiconductor wafer is also provided which employs the use of the knife edge ring. Developer is supplied onto the top surface of a wafer. Spraying solution is sprayed onto the bottom surface of the wafer. The knife edge ring guides the developer and the cleaning solution remaining on the bottom surface of the wafer's edge along an inclined portion formed at an outer side wall of the knife edge ring and causes the developer and the cleaning solution to flow into a plurality of discharge holes.
机译:提供了一种在半导体制造期间使用的刀口环装置,该刀口环装置包括具有内侧壁,外侧壁和具有预定宽度的顶表面的环形体。多级倾斜部分形成在外侧壁中,并且多个排放孔穿透主体。每个排出孔具有与之相关联的入口,其位于倾斜部分处。刀刃环可将显影剂和清洁溶液从晶片上排出。还提供了一种清洁半导体晶片的底表面的方法,该方法采用了刀刃环。显影剂被供应到晶片的顶表面上。喷射溶液被喷射到晶片的底表面上。刀边缘环沿着形成在刀边缘环的外侧壁上的倾斜部分引导残留在晶片边缘的底面上的显影剂和清洁溶液,并使显影剂和清洁溶液流入多次排出。孔。

著录项

  • 公开/公告号KR100763332B1

    专利类型

  • 公开/公告日2007-10-04

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20060015335

  • 发明设计人 최덕규;

    申请日2006-02-16

  • 分类号H01L21/304;

  • 国家 KR

  • 入库时间 2022-08-21 20:31:17

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