首页> 外国专利> CHEMICAL ETCHING SOLUTION FOR TUNGSTEN OR AN ALLOY OF TUNGSTEN-TITANIUM

CHEMICAL ETCHING SOLUTION FOR TUNGSTEN OR AN ALLOY OF TUNGSTEN-TITANIUM

机译:钨或钨钛合金的化学蚀刻溶液

摘要

An etching solution for tungsten or a titanium-tungsten metal alloy is provided to etch an under bumper metal of a flip chip without attacking a copper UBM(Under bumper metallurgy) layer or rapidly disintegrating a hydrogen peroxide by using the etching solution containing 0.001 to 2% of a copper corrosion inhibiting agent by weight, wherein the copper inhibiting agent is an azole based chemical compound, 5 to 30% of hydrogen peroxide by weight, 0.001 to 2% of a stabilizer by weight, and the water making up the rest of the total weight of the etching solution. An etching solution for tungsten or a titanium-tungsten metal alloy contains 5 to 30% of hydrogen peroxide by weight as a main oxidizer, 0.01 to 5% of a stabilizer by weight, 0.001 to 2% of a copper corrosion inhibiting agent and water making up the rest of the total weight of the etching solution. The stabilizer is a phosphoric acid or a phosphate. The copper corrosion inhibiting agent is an azole based chemical compound. The phosphoric acid or the phosphate is selected from a group consisting of a monoammonium phosphate, a diammonium phosphate, an ammonium phosphate, a monosodium phosphate, a disodium phosphate, a trisodium phosphate, a monopotassium phosphate, a dipotassium phosphate, a tribasic potassium phosphate, a diphosphoric acid, a sodium diphosphoric acid, a potassium pyro phosphate, and an ammonium diphosphoric acid. The azole based chemical compound is selected from a group consisting an aminotetrazole, a mercapto-thiazole, a benzotriazole, a hydroxyl-thiazole, an amino-benzotriazole, an amino-thiazole, an acetylimidazole, an acetyle-thiazole, an amino-triazole, and a benzlimidazole. The etching solution is used to etch an under bump metal of a flip chip. The under bump metal contains the tungsten or the titanium-tungsten metal alloy. A solder bump which is a metal contact layer of the under bump metal, is composed of a copper/tin-silver metal alloy.
机译:提供一种用于钨或钛钨金属合金的蚀刻溶液,以蚀刻倒装芯片的下保险杠金属,而不会腐蚀铜UBM(保险杠下冶金)层或通过使用含有0.001至2的蚀刻溶液来快速分解过氧化氢。铜腐蚀抑制剂的重量百分比,其中铜抑制剂是基于唑的化合物,过氧化氢的重量百分比为5至30%,稳定剂的重量百分比为0.001至2%,其余部分则为水蚀刻溶液的总重量。用于钨或钛-钨金属合金的蚀刻溶液包含按重量计5至30%的过氧化氢作为主要氧化剂,按重量计0.01至5%的稳定剂,0.001至2%的铜腐蚀抑制剂和水增加蚀刻溶液总重量的其余部分。稳定剂是磷酸或磷酸盐。铜腐蚀抑制剂是基于唑的化合物。磷酸或磷酸盐选自磷酸一铵,磷酸氢二铵,磷酸铵,磷酸二氢钠,磷酸二钠,磷酸三钠,磷酸氢二钾,磷酸氢二钾,磷酸三钾,二磷酸,二磷酸钠,焦磷酸钾和二磷酸铵。所述基于唑的化合物选自氨基四唑,巯基噻唑,苯并三唑,羟基噻唑,氨基苯并三唑,氨基噻唑,乙酰基咪唑,乙酰基噻唑,氨基三唑,和苯甲咪唑。该蚀刻溶液用于蚀刻倒装芯片的凸块下金属。凸块下金属包含钨或钛钨金属合金。作为下凸点金属的金属接触层的焊料凸点由铜/锡银金属合金构成。

著录项

  • 公开/公告号KR20070103856A

    专利类型

  • 公开/公告日2007-10-25

    原文格式PDF

  • 申请/专利权人 DONGWOO FINE-CHEM CO. LTD.;

    申请/专利号KR20060035721

  • 发明设计人 LEE JAE YOUN;LEE JOON WOO;CHIN YOUNG JUN;

    申请日2006-04-20

  • 分类号C23F1/10;C23F1/44;C23F1/38;

  • 国家 KR

  • 入库时间 2022-08-21 20:33:25

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