The present invention relates to a transfer head of a test handler. According to the present invention, while holding a customer tray located in a downward direction, another customer tray located in a downward direction can be grasped or released by loading a test handler. Or a technique related to the transfer head of the test handler that can improve the processing speed by improving the operation rate of the unloading device.;Test handler, semiconductor device, transfer, transfer head, customer tray, user tray
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