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MOS transistors having a multi-work function metal nitride gate electrode, CMOS integrated circuit devices employing the same, and methods of fabricating the same
MOS transistors having a multi-work function metal nitride gate electrode, CMOS integrated circuit devices employing the same, and methods of fabricating the same
Disclosed is a MOS transistor including a multi-work function metal nitride gate electrode. The MOS transistor comprises a semiconductor substrate and a central gate electrode formed on the semiconductor substrate. The central gate electrode is formed of a metal nitride layer. A source side gate electrode and a drain side gate electrode are formed on respective opposite sidewalls of the central gate electrode. The source and drain side gate electrodes are composed of doped metal nitride containing first impurities having an electronegativity less than that of nitrogen or second impurities having an electronegativity greater than that of nitrogen.
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