首页> 外国专利> Non-volatile memory cell e.g. flash memory cell, for semiconductor device, has transistors reducing leakage currents that flow through non-volatile programmable resistors, respectively

Non-volatile memory cell e.g. flash memory cell, for semiconductor device, has transistors reducing leakage currents that flow through non-volatile programmable resistors, respectively

机译:非易失性存储单元用于半导体器件的闪存单元具有分别减少流经非易失性可编程电阻器的泄漏电流的晶体管

摘要

The memory cell (500) has two transistors (501, 502) whose source and drain connections are, respectively, coupled with nodes (503, 504). Transistors (509, 510) reduce leakage currents, which flow through non-volatile programmable resistors (507, 508), respectively. Source or drain connections of the resistors are coupled with connectors of the resistors or with connectors of the transistor (501, 502), respectively. An independent claim is also included for a semiconductor device with a non-volatile memory cell.
机译:存储单元(500)具有两个晶体管(501、502),其源极和漏极连接分别与节点(503、504)耦合。晶体管(509、510)减小泄漏电流,该泄漏电流分别流过非易失性可编程电阻器(507、508)。电阻器的源极或漏极连接分别与电阻器的连接器或晶体管(501、502)的连接器耦合。对于具有非易失性存储单元的半导体器件也包括独立权利要求。

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