首页> 外国专利> Sample examination, involves bringing substance of sample in sample region to be detected in condition, and providing optical signal such that vertical wave with defined intensity-zero is formed in sample region to be detected

Sample examination, involves bringing substance of sample in sample region to be detected in condition, and providing optical signal such that vertical wave with defined intensity-zero is formed in sample region to be detected

机译:样品检查包括将样品的物质带入要检测的样品区域中,并提供光信号,从而在要检测的样品区域中形成强度为零的垂直波。

摘要

The process involves bringing a substance of a sample in a sample region to be detected in a condition. Another condition is induced by optical signals, and spatial limited partial regions within the sample region to be detected are omitted in a selective manner. The optical signal is provided such that a vertical wave (9) with defined intensity-zero is formed in the sample region to be detected, where the vertical wave is generated by focusing coherent light rays (10,11) in a pupil of an objective (13). The coherent light rays are provided by using glass fibers. An independent claim is also included for a microscope, in particular laser-raster-fluorescence microscope for spatial high resolution examination of samples.
机译:该过程包括将样品的物质置于要在某种条件下进行检测的样品区域中。光信号引起另一种情况,并且以选择性的方式省略了要检测的样本区域内的空间有限的局部区域。提供光信号,使得在要检测的样本区域中形成强度为零的垂直波(9),其中通过将相干光线(10,11)聚焦在物镜的光瞳中产生垂直波(13)。通过使用玻璃纤维来提供相干光线。还包括显微镜的独立权利要求,特别是用于样品的空间高分辨率检查的激光光栅荧光显微镜。

著录项

  • 公开/公告号DE102006009833A1

    专利类型

  • 公开/公告日2007-09-06

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS CMS GMBH;

    申请/专利号DE20061009833

  • 发明设计人 DYBA MARCUS;GUGEL HILMAR;

    申请日2006-03-01

  • 分类号G01N21/64;G02B21/00;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:23

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