The present invention provides a method for determining an estimate of system-level yield loss for an electronic system comprising individual components subject to manufacturing process variability leading to manufacturing defects. The method comprises obtaining a description of the composition of said electronic system in terms of which individual components are used; obtaining statistical properties of the performance of individual components of the electronic system with respect to 1 st and 2 nd performance variables, e.g. energy consumption and delay, the statistical properties including correlation information of the 1 st and 2 nd performance variables; obtaining information about execution of an application on the system, e.g. a number of accesses of a component by an application, and propagating the statistical properties of the 1 st and 2 nd performance variables of the individual components to the electronic system so that the correlations between the 1 st and 2 nd performance variables are preserved, the propagating taking into account the application information.
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