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ILLUMINANCE EQUALIZING SYSTEM, EXPOSURE APPARATUS, EXPOSURE METHOD, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE

机译:半导体装置的照度均衡系统,曝光装置,曝光方法及制造方法

摘要

PROBLEM TO BE SOLVED: To provide an illuminance equalizing optical system which eliminates impurity efficiently.;SOLUTION: The illuminance equalizing optical systems (351a, 351b) include a plurality of optical elements (3511a, 3511b), and emit light onto the optical elements (3511a, 3511b) and condense light therefrom to offer equalized illuminance. Adsorption elements (1011) adsorbing an impurity are arranged between the optical elements (3511a, 3511b).;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种能有效消除杂质的照度均衡光学系统;解决方案:照度均衡光学系统(351a,351b)包括多个光学元件(3511a,3511b),并向这些光学元件发射光( 3511a,3511b)并从那里聚光以提供均匀的照度。在光学元件(3511a,3511b)之间配置有吸附杂质的吸附元件(1011)。版权所有:(C)2008,日本特许厅&INPIT

著录项

  • 公开/公告号JP2008153396A

    专利类型

  • 公开/公告日2008-07-03

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20060339080

  • 发明设计人 AOKI TAKASHI;

    申请日2006-12-15

  • 分类号H01L21/027;G03F7/20;G21K1/06;G21K5/02;

  • 国家 JP

  • 入库时间 2022-08-21 20:24:20

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