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CALIBRATION DEVICE OF SEMICONDUCTOR TESTER AND MAINTENANCE METHOD OF CALIBRATION DEVICE

机译:半导体测试仪的校准装置及校准装置的维护方法

摘要

PROBLEM TO BE SOLVED: To provide a calibration device capable of easily exchanging a pin for calibration in a short time.;SOLUTION: The calibration device 40 calibrating the semiconductor tester 100 includes: a calibration head 120 moving in a plane parallel to an arrangement surface of conductive pads and moving in a direction perpendicular to the arrangement surface of the conductive pads, for calibrating the semiconductor tester; a calibration metal pin 41 detachably mounted on the head and brought into contact with the conductive pad; a case 200 stationary with respect to a contact board during calibration of the semiconductor tester and accommodating the head and the metal pin; and a pin holder 400 including a holding part 420 for holding the metal pin and stationary with respect to the case, wherein the head is separated from the pin holder 400 to pull out the metal pin from the head in such a state that the holding part holds the metal pin.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种能够在短时间内容易地更换引脚以进行校准的校准设备;解决方案:校准半导体测试仪100的校准设备40包括:在平行于布置表面的平面内移动的校准头120。校准并在垂直于导电垫的布置表面的方向上移动导电垫,以校准半导体测试仪;校准金属销41可拆卸地安装在头部上并与导电垫接触。在半导体测试仪的校准期间相对于接触板静止的壳体200,并容纳头部和金属销。销保持器400包括保持部420,该保持部420用于保持金属销并且相对于壳体固定,其中,头部与销保持器400分离,以在保持部保持状态下从头部拉出金属销。握住金属销。版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008039420A

    专利类型

  • 公开/公告日2008-02-21

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP;

    申请/专利号JP20060210102

  • 发明设计人 KONDO SATORU;

    申请日2006-08-01

  • 分类号G01R31/28;

  • 国家 JP

  • 入库时间 2022-08-21 20:22:46

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