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Calibration device for the calibration of a tester channel of a tester device, the tester system and method for calibrating a tester channel

机译:用于校准测试仪设备的测试仪通道的校准设备,测试仪系统和校准测试仪通道的方法

摘要

Calibration device (20, 30, 40) for the calibration of a tester channel (14) of a tester device (12), with the integrated components on a substrate wafer (1) for testing can be contacted with electrical signals,the calibration device (20, 30, 40) a coupling means and a flat contact carrier, with a first contact surface (2, 47) and a of the first contact surface (2, 47) isolated second contact surface (3, 49), the through the connecting means (5) are electrically connected to,the connecting device (5) is adapted to the first and second contact surface (2, 3, 47, 49) with the tester device (12) to connect,the first contact surface (2, 47) substantially from the second contact surface is surrounded, so that when one is connected to the tester device (12) is connected to the needle card (15) on the contact carrier of the calibration device (20, 30, 40) one of the contacting needles (16) of the needle card (15) which, with the tester channel anyway to be calibrated is connected to the first, the contact surface (2, 47) is placed..
机译:用于校准测试仪装置(12)的测试仪通道(14)的校准装置(20、30、40)可以与电信号接触,该集成装置在基板晶片(1)上用于测试的集成组件可以与电信号接触。 (20、30、40)耦合装置和平坦的接触载体,具有第一接触表面(2、47)和与第一接触表面(2、47)隔离的第二接触表面(3、49),连接装置(5)电连接,连接装置(5)与第一和第二接触表面(2、3、47、49)适配,测试仪装置(12)连接第一接触表面(5)。如图2,图47所示,第二接触表面基本上从第二接触表面被包围,从而当一个被连接到测试仪设备(12)时被连接到校准设备(20、30、40)的接触载体上的针卡(15)。针卡(15)的一根接触针(16)中的一根,无论如何都要通过测试仪通道进行校准,放置了接触面(2,47)。

著录项

  • 公开/公告号DE10333101B4

    专利类型

  • 公开/公告日2008-05-21

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE2003133101

  • 发明设计人

    申请日2003-07-21

  • 分类号G01R35/00;G01R31/28;

  • 国家 DE

  • 入库时间 2022-08-21 19:50:09

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