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WITHSTAND VOLTAGE TEST METHOD FOR THREE-TERMINAL CAPACITOR, AND WITHSTAND VOLTAGE TESTER THEREOF

机译:三端子电容器的耐电压测试方法及其耐电压测试仪

摘要

PROBLEM TO BE SOLVED: To provide a technology for significantly reducing test man-hours for the withstand voltage test of a three-terminal capacitor using a simple device, and for making the withstand voltage test by a one-time withstand voltage test process of the three-terminal capacitor to be tested completed.;SOLUTION: A test voltage device 5A is connected between the first external terminal 1a and the second external terminal 1b via a leakage current restriction element 5B that comprises a resistance, a constant-current diode, or the like. The test voltage device 5A is a device integrated into a withstand voltage tester, for applying a DC voltage between the first external terminal 1a and the second external terminal 1b. A surge-absorbing element 6 is connected between the first external terminal 1a and the third external terminal 1c. A surge-absorbing element 7 is connected between the second external terminal 1b and the third external terminal 1c.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种技术,该技术可大大减少使用简单设备对三端电容器的耐压测试的测试工时,并通过一次性的耐压测试过程进行耐压测试。解决方案:解决方案:测试电压装置5A通过泄漏电流限制元件5B连接在第一外部端子1a和第二外部端子1b之间,该泄漏电流限制元件5B包括电阻,恒流二极管或类似。测试电压装置5A是集成到耐压测试器中的装置,用于在第一外部端子1a和第二外部端子1b之间施加DC电压。在第一外部端子1a与第三外部端子1c之间连接有电涌吸收元件6。浪涌吸收元件7连接在第二外部端子1b和第三外部端子1c之间。版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008180546A

    专利类型

  • 公开/公告日2008-08-07

    原文格式PDF

  • 申请/专利权人 SHOWA DENKI KK;

    申请/专利号JP20070012894

  • 发明设计人 TAKAHASHI HIROSHI;

    申请日2007-01-23

  • 分类号G01R31/18;H01G13/00;

  • 国家 JP

  • 入库时间 2022-08-21 20:22:09

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