首页> 外国专利> SUBSTRATE POTENTIAL GENERATING CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE PROVIDED WITH SAME

SUBSTRATE POTENTIAL GENERATING CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE PROVIDED WITH SAME

机译:具备相同功能的基板电位产生电路和半导体存储器

摘要

PROBLEM TO BE SOLVED: To solve such a problem that in a semiconductor memory device provided with a substrate potential generating circuit, when operation is shifted from high speed operation to refresh operation, a time period of high temperature and large substrate potential exists, in this time period, a junction leak current becomes large due to high temperature and high junction bias voltage, thereby, defective refresh is caused in a memory cell having a short data holding time.;SOLUTION: The substrate potential generating circuit outputs a substrate potential by an oscillation control signal in which a reference potential having temperature dependency is compared with a substrate potential. The reference potentia is made high in high temperature and the substrate potential is made low by making the reference potential be the reference potential having temperature dependency. Occurrence of defective refresh of a DRAM can be prevented by making the substrate potential low and suppressing junction leak of the memory cell in high temperature.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:为了解决这样的问题,在具有衬底电势产生电路的半导体存储装置中,当操作从高速操作转移到刷新操作时,存在高温和大衬底电势的时间段。时间段内,由于高温和高结偏置电压导致结漏电流变大,从而在具有短数据保持时间的存储单元中引起不良刷新。振荡控制信号,其中将具有温度依赖性的参考电势与基板电势进行比较。通过使基准电位成为具有温度依赖性的基准电位,可以使高温下的基准电位高,基板电位低。可以通过降低衬底电位并抑制高温下存储单元的结泄漏来防止DRAM出现不良刷新。;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008004230A

    专利类型

  • 公开/公告日2008-01-10

    原文格式PDF

  • 申请/专利权人 ELPIDA MEMORY INC;

    申请/专利号JP20060175327

  • 发明设计人 INOUE TAIICHI;

    申请日2006-06-26

  • 分类号G11C11/4074;H02M3/07;H01L21/822;H01L27/04;

  • 国家 JP

  • 入库时间 2022-08-21 20:18:53

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