首页> 外国专利> In formation manner of the semiconductor substrate and the electric field effective die transistor and SiGe formation and formation manner of the deformation Si formation which uses this and on the production mannered null Si substrate

In formation manner of the semiconductor substrate and the electric field effective die transistor and SiGe formation and formation manner of the deformation Si formation which uses this and on the production mannered null Si substrate

机译:半导体衬底和电场有效管芯晶体管的形成方式以及使用该方法的SiGe形成和变形Si形成的形成方式以及使用这种方法制造的空Si衬底

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor substrate with a low feedthrough dislocation density and surface roughness, a field effect transistor, a forming method of an SiGe layer and a forming method of a distorted Si layer using the same, and to provide a manufacturing method of the field effect transistor.;SOLUTION: The semiconductor substrate is provided with, on an Si substrate, an SiGe buffer layer on which a plurality of SiGe inclined composition layers in which a composition ratio of Ge is gradually increased toward the surface are laminated. Each of these inclined composition layers is constituted so that a compositional ratio of Ge of the lower layers of upper inclined composition layers of the two adjacent inclined composition layers is larger than that of the upper layers of lower inclined composition layers.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:为了提供具有低贯通位错密度和表面粗糙度的半导体衬底,场效应晶体管,使用其的SiGe层的形成方法和变形的Si层的形成方法,并提供制造方法。解决方案:半导体衬底在Si衬底上提供一个SiGe缓冲层,在该SiGe缓冲层上层叠了多个SiGe倾斜的组分层,其中Ge的组成比朝着表面逐渐增加。这些倾斜成分层中的每一个的构成使得两个相邻倾斜成分层的上倾斜成分层的下层的Ge的组成比大于下倾斜成分层的上层的Ge的组成比。 )2003年,日本特许厅

著录项

  • 公开/公告号JP4039013B2

    专利类型

  • 公开/公告日2008-01-30

    原文格式PDF

  • 申请/专利权人 株式会社SUMCO;

    申请/专利号JP20010206385

  • 发明设计人 塩野 一郎;山口 健志;水嶋 一樹;

    申请日2001-07-06

  • 分类号H01L29/78;H01L21/205;H01L21/338;H01L29/778;H01L29/812;

  • 国家 JP

  • 入库时间 2022-08-21 20:17:43

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