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Integrated Nitride and Silicon Carbide-Based Devices and Methods of Fabricating Integrated Nitride-Based Devices

机译:基于氮化物和碳化硅的集成器件以及基于氮化物的集成器件的制造方法

摘要

Monolithic electronic devices including a common nitride epitaxial layer are provided. A first type of nitride device is provided on the common nitride epitaxial layer including a first at least one implanted n-type region on the common nitride epitaxial layer. The first at least one implanted n-type region has a first doping concentration greater than a doping concentration of the common nitride epitaxial layer. A second type of nitride device, different from the first type of nitride device, including a second at least one implanted n-type region is provided on the common nitride epitaxial layer. The second at least one implanted n-type region is different from the first at least one implanted n-type region and has a second doping concentration that is greater than the doping concentration of the common nitride epitaxial layer. A first plurality of electrical contacts are provided on the first at least one implanted n-type region. The first plurality of contacts define a first electronic device of the first type of nitride device. A second plurality of electrical contacts are provided on the second at least one n-type implanted region. The second plurality of contacts define a second electronic device of the second type of electronic device. Corresponding methods are also disclosed.
机译:提供了包括公共氮化物外延层的单片电子器件。在公共氮化物外延层上提供第一类型的氮化物器件,该公共氮化物器件包括在公共氮化物外延层上的第一至少一个注入的n型区域。第一至少一个注入的n型区域具有的第一掺杂浓度大于公共氮化物外延层的掺杂浓度。在公共氮化物外延层上提供与第一类型氮化物装置不同的第二类型氮化物装置,其包括第二至少一个注入的n型区域。第二至少一个注入的n型区域不同于第一至少一个注入的n型区域,并且具有第二掺杂浓度,该第二掺杂浓度大于公共氮化物外延层的掺杂浓度。在第一至少一个植入的n型区域上提供第一多个电触点。所述第一多个触点限定了第一类型的氮化物器件的第一电子器件。在第二至少一个n型植入区域上提供第二多个电触点。第二多个触点限定第二类型的电子设备的第二电子设备。还公开了相应的方法。

著录项

  • 公开/公告号US2008169474A1

    专利类型

  • 公开/公告日2008-07-17

    原文格式PDF

  • 申请/专利权人 SCOTT T. SHEPPARD;

    申请/专利号US20080051303

  • 发明设计人 SCOTT T. SHEPPARD;

    申请日2008-03-19

  • 分类号H01L27/06;H01L21/8232;

  • 国家 US

  • 入库时间 2022-08-21 20:15:51

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