首页> 外国专利> INCORPORATION OF CARBON IN SILICON/SILICON GERMANIUM EPITAXIAL LAYER TO ENHANCE YIELD FOR Si-Ge BIPOLAR TECHNOLOGY

INCORPORATION OF CARBON IN SILICON/SILICON GERMANIUM EPITAXIAL LAYER TO ENHANCE YIELD FOR Si-Ge BIPOLAR TECHNOLOGY

机译:在硅/硅锗表皮层中掺入碳以增强Si-Ge双极技术的产量

摘要

A SiGe bipolar transistor containing substantially no dislocation defects present between the emitter and collector region and a method of forming the same are provided. The SiGe bipolar transistor includes a collector region of a first conductivity type; a SiGe base region formed on a portion of said collector region; and an emitter region of said first conductivity type formed over a portion of said base region, wherein said collector region and said base region include carbon continuously therein. The SiGe base region is further doped with boron.
机译:提供了一种在发射极和集电极区域之间基本不存在位错缺陷的SiGe双极晶体管及其形成方法。所述SiGe双极晶体管包括第一导电类型的集电极区。在所述集电极区的一部分上形成的SiGe基极区;所述第一导电类型的发射极区域形成在所述基极区域的一部分上,其中,所述集电极区域和所述基极区域在其中连续地包含碳。 SiGe基极区进一步掺杂有硼。

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