VOLTAGE TUNE PROBE, AN INTEGRATED CIRCUIT AND A PHASE LOCKED LOOP HAVING A VOLTAGE TUNE PROBE, AND A METHOD OF SCREENING AN INTEGRATED CIRCUIT EMPLOYING A PHASE LOCKED LOOP THEREOF

摘要

An integrated circuit, a phase locked loop, a voltage tune probe and a method of screening an integrated circuit employing a phase locked loop thereof. In one embodiment, the integrated circuit includes: (1) an input/output port configured to provide an external interface for the integrated circuit, (2) a phase locked loop having a voltage tune line coupled to a voltage controlled oscillator and (3) a voltage tune probe having a first switch coupled to a second switch and a capacitor coupled therebetween. The first switch is coupled to the voltage tune line and the second switch is coupled to the input/output port.