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Measure control delay and method having latching circuit integral with delay circuit

机译:量测控制延迟和具有与延迟电路集成在一起的锁存电路的方法

摘要

A measure control delay includes a measuring delay line and a signal generating delay line, each of which include a plurality of series-connected delay units. A digital signal is applied to an initial delay unit in the measuring delay line and it sequentially propagates through the delay units until a second digital signal is received. These outputs are applied to control inputs to the signal generating delay line to control the number of delay units through which a clock signal propagates before being output from a final delay unit. Each of the delay units in the measuring delay line includes a pair of series connected NOR gates. A NOR gate to which the digital signal is initially applied is coupled to a second NOR gate as a flip-flop so that the output of the NOR gate remains constant after the digital signal has been applied to the measuring delay line.
机译:测量控制延迟包括测量延迟线和信号生成延迟线,每个测量延迟线和信号生成延迟线包括多个串联连接的延迟单元。数字信号被施加到测量延迟线中的初始延迟单元,并且其依次传播通过延迟单元,直到接收到第二数字信号为止。这些输出被施加到信号生成延迟线的控制输入,以控制时钟信号从最终延迟单元输出之前通过其传播的延迟单元的数量。测量延迟线中的每个延迟单元包括一对串联的或非门。最初将数字信号施加到的NOR门与第二NOR门相连,作为触发器,以便在将数字信号施加到测量延迟线之后,NOR门的输出保持恒定。

著录项

  • 公开/公告号US7408394B2

    专利类型

  • 公开/公告日2008-08-05

    原文格式PDF

  • 申请/专利权人 DAVID A. ZIMLICH;

    申请/专利号US20070900451

  • 发明设计人 DAVID A. ZIMLICH;

    申请日2007-09-11

  • 分类号H03H11/26;

  • 国家 US

  • 入库时间 2022-08-21 20:09:48

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