首页> 外国专利> Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes

Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes

机译:使用原子力显微镜/扫描隧道显微镜尖端阵列扫描纳代码

摘要

A surface analysis device is disclosed for identifying molecules by simultaneously scanning nanocodes on a surface of a substrate. The device includes a scanning array that is capable of simultaneously scanning the nanocodes on the surface of the substrate and an analyzer that is coupled with the scanning array. The analyzer is capable of receiving simultaneously scanned information from the scanning array and identifying molecules associated with the nanocodes.
机译:公开了一种表面分析装置,用于通过同时扫描基板表面上的纳米代码来识别分子。该装置包括能够同时扫描基板表面上的纳代码的扫描阵列和与扫描阵列耦合的分析仪。分析仪能够从扫描阵列同时接收扫描的信息,并识别与纳代码相关的分子。

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