首页> 外国专利> METHOD FOR LASER MICROSTRUCTURING A MATERIAL USING A PROTECTIVE LAYER WITH A THRESHOLD INTENSITY DEFINED BY REFLECTION AND ABSORPTION CHARACTERISTICS

METHOD FOR LASER MICROSTRUCTURING A MATERIAL USING A PROTECTIVE LAYER WITH A THRESHOLD INTENSITY DEFINED BY REFLECTION AND ABSORPTION CHARACTERISTICS

机译:使用具有反射和吸收特性定义的阈值强度的保护层对材料进行激光微结构化的方法

摘要

The invention relates to a method for microstructuring a material, whereby, during a structuring step, material is removed by means of a laser beam comprising a region with increased intensity in the beam cross-section thereof. According to the invention, a protective layer is applied to the surface to be structured before the structuring step is carried out. The threshold intensity defined by the reflection and absorption characteristics is adapted to the laser radiation such that the protective layer only evaporates in the region of the increased intensity during a pre-determined irradiation period, in order to release the material surface below for the structuring.
机译:本发明涉及一种对材料进行微结构化的方法,其中,在结构化步骤中,借助于激光束去除材料,该激光束包括在其光束截面中具有增加强度的区域。根据本发明,在进行结构化步骤之前,将保护层施加到待结构化的表面上。由反射和吸收特性限定的阈值强度适合于激光辐射,使得保护层仅在预定的照射时间段内在强度增加的区域中蒸发,以便释放下面的材料表面以进行结构化。

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