LASER SCANNING MICROSCOPE AND LASER SCANNING MICROSCOPY METHOD FOR MEASURING DIFFUSELY REFLECTED ILLUMINATING RADIATION

摘要

Laser scanning microscope for measuring diffusely reflected illuminating radiation, with a detector, a detection beam path (DS), which extends from the object under investigation to the detector, a beam splitter which is arranged at an injection location in the detection beam path (DS) and splits the cross section of the detection beam path (DS) at the injection location into a first and a second region, a laser for producing illuminating radiation which is injected via the beam splitter into the first part, which extends from the injection location to the object, of the detection beam path (DS) and is guided to the object, wherein only the illuminating radiation which is incident on the first region is injected into the detection beam path (DS) and wherein only that proportion of the illuminating radiation, which is reflected by the object and travels along the detection beam path (DS) to the beam splitter, that is incident on the second region is injected into the second part, which extends from the beam splitter to the detector, of the detection beam path (DS) in order to detect the diffusely reflected proportion of the reflected illuminating radiation.