Arrangement for measuring the irradiation power occurring in a laser scanning microscope or the light power reflected and diffusely scattered on the irradiated object or the difference between the two powers

摘要

In the arrangement, the photoelements 1 and 2 are arranged in such a manner that the light in the optical beam path between light source and object either passes through both photoelements or is reflected at them or passes through one photoelement and is reflected at the other, and that either both photoelements are connected together electrically in anti-parallel to form a two-port network or both photoelements are electrically connected on one side with respectively one input of the weighted-summing current/voltage converter 3, while their counter-electrodes are respectively at a constant reference potential. By means of the weighted summation or difference formation, with a corresponding selection of amount and sign of the weighting factors, an output signal proportional to the irradiated, reflected or absorbed light power results. The measuring arrangement is particularly suitable for integration in a microscope objective or for the construction of a measuring probe independent of the microscope. IMAGE