首页> 外国专利> Electronic integrated circuit fabricating method, involves forming etch mask in copolymer layer, forming another etch mask by etching dielectric material through former etch mask, and removing sacrificial material through latter etch mask

Electronic integrated circuit fabricating method, involves forming etch mask in copolymer layer, forming another etch mask by etching dielectric material through former etch mask, and removing sacrificial material through latter etch mask

机译:电子集成电路的制造方法,包括在共聚物层中形成蚀刻掩模,通过之前的蚀刻掩模蚀刻介电材料来形成另一蚀刻掩模,以及通过后面的蚀刻掩模去除牺牲材料。

摘要

The method involves depositing a diblock copolymer layer on a dielectric layer, and forming an etch mask (9) in the copolymer layer by selective removal of polymethyl methacrylate. Another etch mask (10) is formed by etching dielectric material through the etch mask (9). The sacrificial material (6) is removed through the etch mask (10). The mask (9) comprises set of holes having an array pitch less than or equal to distance between cavities of a layer (4) of an integrated circuit. The layer (4) is made of silicon dioxide.
机译:该方法包括在介电层上沉积二嵌段共聚物层,并通过选择性地去除聚甲基丙烯酸甲酯在共聚物层中形成蚀刻掩模(9)。通过通过蚀刻掩模(9)蚀刻介电材料来形成另一蚀刻掩模(10)。通过蚀刻掩模(10)去除牺牲材料(6)。掩模(9)包括一组孔,这些孔的阵列节距小于或等于集成电路的层(4)的腔之间的距离。层(4)由二氧化硅制成。

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