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Optical system eccentricity measuring device and an optical system eccentricity measurement method

机译:光学系统偏心测量装置及光学系统偏心测量方法

摘要

PROBLEM TO BE SOLVED: To make measurable the eccentricity of a plane to be measured after the easy and reliable specification of an image of the plane to be measured from among images on a light receiving elements.;SOLUTION: This eccentricity measuring apparatus 100 is provided with both a light source for emitting luminous flux having a coherence length shorter than a prescribed optical distance and a polarization beam splitter 4 for dividing the luminous flux into first luminous flux toward the first plane to be measured 51 and second luminous flux toward a plane mirror 11. The eccentricity measuring apparatus 100 is provided with: a measuring optical system 6 for irradiating the first plane to be measured 51 with the first luminous flux; a moving stage 12 for adjusting at least either the optical path length of the first luminous flux or that of the second optical path length reflected at the first plane to be measured 51; a light receiving element 20 for receiving the first luminous flux and the second luminous flux reflected at the first plane to be measured 51; and an eccentricity computing part 22 for determining the eccentricity of the first plane to be measured 51 by computations.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:为了在从受光元件上的图像之中容易且可靠地确定待测平面的图像之后,使待测平面的偏心度可测量。解决方案:提供了该偏心度测量装置100具有用于发射相干长度短于规定的光学距离的光束的光源和用于将光束分成朝向被测量的第一平面的第一光束51和朝向平面镜的第二光束的偏振光束分离器4。偏心率测量装置100包括:测量光学系统6,用于向第一待测平面51照射第一光束。移动台12,用于至少调整在第一待测平面51上反射的第一光束的光程长度或第二光束的光程长度。受光元件20,用于接收在第一被测定面51反射的第一光束和第二光束。偏心度计算部分22,用于通过计算确定要测量的第一平面51的偏心度。版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP4323230B2

    专利类型

  • 公开/公告日2009-09-02

    原文格式PDF

  • 申请/专利权人 オリンパス株式会社;

    申请/专利号JP20030173553

  • 发明设计人 伊藤 直;河村 淳;

    申请日2003-06-18

  • 分类号G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:40:08

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