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Characteristic extraction method and characteristic extraction apparatus for semiconductor integrated circuit
Characteristic extraction method and characteristic extraction apparatus for semiconductor integrated circuit
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机译:半导体集成电路的特征提取方法和特征提取装置
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摘要
A method for efficiently extracting a variation distribution of a characteristic for a semiconductor integrated circuit. The method extracts a characteristic distribution of a semiconductor integrated circuit by performing a mathematical analysis using a polynomial expression based on a variation distribution of a process sensitivity parameter.
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