AFM TWEEZERS, MANUFACTURING METHOD OF AFM TWEEZERS, AND SCANNING TYPE PROBE MICROSCOPE

摘要

PPROBLEM TO BE SOLVED: To provide AFM tweezers capable of reconciling accurate observation with stable gripping in a scanning type probe microscope. PSOLUTION: The AFM tweezers comprise a first probe 10B capable of using the tip of an edge of a triangle pole member as a probe of the scanning type probe microscope and a second probe 20B formed of a triangle pole member disposed openably/closably to the first probe 10B. The probes 10B and 20B are arranged in parallel so that predetermined circumference surfaces of respective triangle pole members face each other in a substantially parallel state. A notch section 100 for preventing interference with a sample when the sample is scanned by the tip of the edge is formed in the first probe 10B. PCOPYRIGHT: (C)2009,JPO&INPIT