首页> 外国专利> Exposure method and exposure apparatus, stage unit, and device manufacturing method having two substrate stages with one stage temporarily positioned below the other stage

Exposure method and exposure apparatus, stage unit, and device manufacturing method having two substrate stages with one stage temporarily positioned below the other stage

机译:具有两个基板台的曝光方法和曝光设备,平台单元和装置制造方法,其中一个平台临时位于另一平台之下

摘要

By an exposure method including a process where in parallel with an exposure operation performed on a wafer on one of the wafer stages, the other wafer stage is temporarily positioned under the one wafer stage in order to interchange both wafer stages, a part of the interchange operation (exchange operation) of both stages according to a procedure of temporarily positioning the other wafer stage under the one wafer stage can be performed in parallel with the exposure operation of the wafer on the one wafer stage. Accordingly, the interchange can be performed in a shorter period of time than when the interchange operation begins from the point where the exposure operation of the wafer on the one wafer stage has been completed.
机译:通过包括与对一个晶片台上的晶片进行的曝光操作并行的处理的曝光方法,将另一个晶片台临时定位在一个晶片台下面,以便交换两个晶片台,交换的一部分可以与将另一个晶片台暂时放置在一个晶片台下面的过程的两个平台的操作(交换操作)并行地在一个晶片台上进行晶片的曝光操作。因此,与从已经完成一个晶片台上的晶片的曝光操作的点开始交换操作相比,可以在更短的时间内执行交换。

著录项

  • 公开/公告号US2009251679A1

    专利类型

  • 公开/公告日2009-10-08

    原文格式PDF

  • 申请/专利权人 YUICHI SHIBAZAKI;

    申请/专利号US20090453996

  • 发明设计人 YUICHI SHIBAZAKI;

    申请日2009-05-28

  • 分类号G03B27/58;

  • 国家 US

  • 入库时间 2022-08-21 19:34:08

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