首页> 外国专利> Method for fabricating a localize SOI in bulk silicon substrate including changing first trenches formed in the substrate into unclosed empty space by applying heat treatment

Method for fabricating a localize SOI in bulk silicon substrate including changing first trenches formed in the substrate into unclosed empty space by applying heat treatment

机译:在块状硅衬底中制造局部SOI的方法,包括通过施加热处理将衬底中形成的第一沟槽改变为未封闭的空白空间

摘要

To change a plurality of trenches to one flat empty space by two-dimensionally forming the trenches on the surface of a semiconductor substrate and then applying heat treatment to the semiconductor substrate.
机译:通过在半导体衬底的表面上二维地形成沟槽,然后对半导体衬底进行热处理,来将多个沟槽改变为一个平坦的空白空间。

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