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Method of making wafer level package structure by grinding the backside thereof and then forming metal layer on the ground side

机译:通过研磨晶片的背面的结构然后在接地侧上形成金属层来制造晶片级封装结构的方法

摘要

A semiconductor wafer is thinned to a predetermined thickness by grinding the backside thereof (which is opposite to the side where a plurality of devices are formed and metal posts are further formed), and then a metal layer made of metal having a linear thermal expansion coefficient close to that of the semiconductor wafer is formed on the ground side. Further, the semiconductor wafer is sealed with resin, metal bumps are bonded to the tops of the metal posts (barrier metal layer), and then the semiconductor wafer is divided into the respective semiconductor devices. Silicon is used as material for the semiconductor wafer, and tungsten or molybdenum is used as metal constituting the metal layer.
机译:通过研磨半导体晶片的背面(与形成多个器件并进一步形成金属柱的一侧相反),将半导体晶片减薄至预定厚度,然后研磨具有线性热膨胀系数的金属制成的金属层在接地侧上形成与半导体晶片接近的晶片。此外,用树脂密封半导体晶片,将金属凸块结合到金属柱(阻挡金属层)的顶部,然后将半导体晶片分成各个半导体器件。硅用作半导体晶片的材料,钨或钼用作构成金属层的金属。

著录项

  • 公开/公告号US7468292B2

    专利类型

  • 公开/公告日2008-12-23

    原文格式PDF

  • 申请/专利权人 TAKAHARU YAMANO;

    申请/专利号US20060546285

  • 发明设计人 TAKAHARU YAMANO;

    申请日2006-10-12

  • 分类号H01L21;

  • 国家 US

  • 入库时间 2022-08-21 19:29:15

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