A SYSTEM WHICH PERMITS AN EMBEDDED MEGACELL WITHIN AN INTEGRATED CIRCUIT TO BE TESTED USING TEST VECTORS APPLIED TO EXTERNAL PINS OF THE INTEGRATED CIRCUIT AND A METHOD OF TESTING A STANDARDIZED MEGACELL

摘要

Specially modified JTAG test circuitry is used to provide test inputs and outputs for vendor supplied 5 megacells with buried IIOs within an integrated circuit chip. A multiplexer or similar circuit is used to alternatively select between a JTAG boundary scan output or a megacell circuit test output in response to JTAG instructions within an instruction register. Additionally, a multiplexer or similar circuit is used to alternatively select between an input pin or normal circuitry for input to a megacell's buried input. Furthermore, an AND or OR gate is used to allow test inputs to a megacell, which are normally tied either high or low, to be controlled by an input pin when in the 10 special JTAG test mode. In this manner, test vectors applied at test inputs to the megacell circuitry result in test outputs to the megacell circuitry being provided on output pins of the integrated circuit without requiring additional input and/or output pins that are solely operational as test inputs or outputs to the megacell circuitry.