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Aluminum foil for the electrolytic capacitor and etching method for forming etching pits

机译:电解电容器用铝箔和形成腐蚀坑的腐蚀方法

摘要

In manufacturing an aluminum foil for the electrolytic capacitor, the present invention permits the productivity to be enhanced by omitting the intermediate annealing step. The etching pits can be formed excellently in the aluminum foil through the non-electrolytic process.;The aluminum foil that may be used has the composition that is composed of 5 to 40 ppm of Si, 5 to 40 ppm of Fe, 0.1 to 3 ppm of Pb and 15 to 150 ppm of Ni, and for the rest, Al and inevitable impurities, in which the inevitable impurities include less than 10 ppm of Cu and the total quantity of the inevitable impurities except Cu is equal to or less than 100 ppm. In the aluminum foil having the above composition, the oxide film has the thickness of 20 to 60 Å and Ni has the ionic strength ratio that is equal to or more than 1.5 at the depth of 0.5 µm, equal to or more than 10 at the depth of 0.1µm and equal to or more than 2 at the depth of 0.3 µm, where it is assumed that the Ni ionic strength is equal to 1 at the depth of 1 µm. Otherwise, Ni has the concentration ratio that is equal to 5 to 50 when it is located deep in the central area of the oxide film, and 80 to 150 when it is located at the interface between the oxide film and the aluminum foil blank, where the 10 nm depth in which Ni is located 10 nm toward the blank from the interface between the oxide film and the aluminum foil blank is assumed to be 1. The etching pit formation may be performed by following the step of removing the surface layer on the aluminum alloy foil including the oxide film by the thickness of 20 to 200 Å by having it contacted by a solution that contains no hydrochloric acid or solution that contains less than 1000 ppm of chloride ions, without conducting electric current, the step of forming etching pits and the step of enlarging the diameters of thus formed etching pits.
机译:在制造用于电解电容器的铝箔时,本发明允许通过省略中间退火步骤来提高生产率。通过非电解工艺,可以在铝箔中极好地形成蚀刻坑。可以使用的铝箔的成分由5至40 ppm的Si,5至40 ppm的铁,0.1至3的成分组成Pb的ppm和Ni的15至150 ppm,其余为Al和不可避免的杂质,其中不可避免的杂质包括少于10 ppm的Cu,除Cu之外的所有不可避免杂质的总量等于或小于100 ppm。在具有上述组成的铝箔中,氧化膜的厚度为20至60埃,并且Ni在0.5μm的深度处具有等于或大于1.5的离子强度比,在Ni时具有等于或大于10的离子强度比。假定深度为0.1 µm,并且在0.3 µm处等于或大于2,其中假定Ni离子强度在1 µm处等于1。否则,当Ni位于氧化膜的中心区域深处时,其浓度比等于5至50,而当Ni位于氧化膜与铝箔坯料之间的界面时,其浓度比等于80至150。假设Ni位于从氧化物膜和铝箔坯料之间的界面朝向坯料10nm处的10nm深度为1。蚀刻凹坑的形成可以通过以下步骤来进行:去除表面上的表面层。通过在不通电的情况下使不与盐酸接触的溶液或氯离子含量小于1000 ppm的溶液接触而形成厚度为20〜200的氧化膜的铝合金箔,形成蚀刻坑的步骤以及增大如此形成的蚀刻坑的直径的步骤。

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