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LONG TRACE PROFILER SYSTEM FOR THREE DIMENSIONAL SURFACE MEASURING

机译:用于三维表面测量的长轨迹轮廓仪系统

摘要

A LTP system for measuring 3-dimentional shape is provided to scan a whole surface of objects without a roundtrip of a transport unit at a time. A LTP(Long Trace Profiler) system for measuring 3-dimentional shape comprises a secondary axis scanner unit(130) changing a route of the laser beam to be parallel; a transport unit(160) moving to a first axis on a plane of measurement of objects(170); the laser beam outputted from the secondary axis scanner unit; a beam path controlling unit(120,150) controlling the route of the laser beam reflected from the objects; and a shape operation unit(190) computing the shape of objects surface by computing an angle of the location where the laser beam is irradiated.
机译:提供一种用于测量3维形状的LTP系统,以一次扫描物体的整个表面而无需往返运输单元。一种用于测量3维形状的LTP(长轨迹轮廓仪)系统,包括次级轴扫描仪单元(130),其将激光束的路径改变为平行。在物体的测量平面(170)上移动到第一轴的运输单元(160);从副轴扫描仪单元输出的激光束;光束路径控制单元(120,150)控制从物体反射的激光束的路径;形状运算单元(190)通过计算照射激光的位置的角度来计算物体表面的形状。

著录项

  • 公开/公告号KR20090023301A

    专利类型

  • 公开/公告日2009-03-04

    原文格式PDF

  • 申请/专利权人 KOREA ELECTRO-OPTICS CO. LTD.;

    申请/专利号KR20080085415

  • 发明设计人 KIM KI HO;

    申请日2008-08-29

  • 分类号G01B11/24;G01B11/00;

  • 国家 KR

  • 入库时间 2022-08-21 19:13:52

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