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Long Trace Profiler system for three dimensional surface measuring

机译:用于三维表面测量的Long Trace Profiler系统

摘要

The present invention relates to a system for three-dimensional shape measurement El UTP using the optical scanning device, in particular blood irradiating a laser beam on the measuring body, and from the measured body by using the position of the reflected laser beam is located on the line passing through the laser beam in the conventional system for measuring the shape of El UTP of the measured body, the electrical control so as to be parallel to the incident laser beam, further comprising a second scanner to the output shaft by changing the path by, first conveying portion as well as the scan axis and a second axis perpendicular to the first axis for scanning movement, and also to be performed at a time, a structure for correcting the error arising in the course of a scan is the invention which is characterized in that further added. ; According to the present invention, there is provided Y- scanner and the error correcting apparatus for three-dimensional shape measurement system, which is used in the El UTP two dimensional slope measuring device, whereby the transfer portion mechanically in a reciprocating without the movement has become possible to scan the entire surface of the measured object at a time.
机译:用于三维形状测量的系统技术领域本发明涉及一种使用光学扫描装置进行三维形状测量的系统,特别是血液将激光束照射到测量体上,并且通过使用反射激光束的位置从被测体上定位血液在传统的用于测量被测物体的El UTP形状的系统中,通过激光束的线,电气控制以平行于入射激光束,还包括通过改变路径到达输出轴的第二个扫描仪通过第一输送部分以及扫描轴线和垂直于第一轴线的第二轴线进行扫描运动,并且还一次执行,用于校正在扫描过程中产生的误差的结构是本发明,特点是进一步补充。 ;根据本发明,提供了一种用于三维形状测量系统的Y型扫描仪和纠错装置,其用于El UTP二维倾斜度测量装置中,由此,传递部分在机械运动中往复运动而没有运动,一次可以扫描被测物体的整个表面。

著录项

  • 公开/公告号KR101023193B1

    专利类型

  • 公开/公告日2011-03-18

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080085415

  • 发明设计人 김기호;

    申请日2008-08-29

  • 分类号G01B11/24;G01B11/00;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:27

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